Materials Characterization


HOME  >  Research  >  Department of Materials Science and Engineering  >  Laboratories  >  Materials Characterization

Materials Characterization



High-resolution TEM image of CeO2 nanoparticle
and its three-dimensional reconstructed volume

Inorganic material such as metal and ceramics is widely used for various kinds of practical applications owing to the wide variation in material properties. Understanding of the origin of material properties requires full knowledge of compositional and structural information at nanoscale. We believe that good understanding of those leads to the improvement of material properties and the development of new material.

We are therefore studying material structure and composition at atomic scale, which is in the order of 0.1 nm, via transmission electron microscopy (TEM)-based technique. We also study thin film fabrication process for better superconducting material. Combining the analysis and the processing, we are aiming to understand the mechanism of material properties and to develop future material as a whole.

In particular, we are good at electron tomography that enables us to characterize three-dimensional material structure at nanoscale and scanning TEM (STEM) that allows us to visualize atomic arrangement of material. As for thin film processing, we use pulsed laser deposition (PLD) method and chemical solution based method. We are dealing with steel, light metal such as aluminum, superconductor, electrocerarmics, and so forth.


Professor Kenji Kaneko
Associate Professor Ryo Teranishi
Associate Professor Yukio Sato

The Main Research Topics

  • Three-dimensional structure and distribution of dislocation and precipitates in stainless steel
  • Microstructural analysis of precipitates in aluminum alloys
  • Development of oxide superconductor utilizing artificial flux pinning center
  • Microscopic origin of physical properties in electroceramics
Back to top